• DocumentCode
    1691430
  • Title

    A Metric Extraction Framework Based on a High-Level Description Language

  • Author

    Alikacem, E.-H. ; Sahraoui, Houari A.

  • Author_Institution
    Centre de Rech. Inf. de Montreal, Montreal, QC, Canada
  • fYear
    2009
  • Firstpage
    159
  • Lastpage
    167
  • Abstract
    Nowadays, many tools are available for metric extraction. However, extending these tools with new metrics or modifying the calculation of existing ones is often difficult, sometimes impossible. Indeed, many of them are black box tools. Others can be extended only by modifying third-party code. Moreover, metric specifications often lack precision, which leads to implementations that do not correspond necessarily to userspsila expectations. In this paper, we propose a flexible approach for metric collection based on a metric description language that allows manipulating basic data extracted from the code. These data are mapped to a generic object-oriented meta-model that is language agnostic. This makes it easy to focus on the metric specification rather than language specific constructs. Metric specifications are interpreted automatically to extract their corresponding values for a target program.
  • Keywords
    data models; formal specification; object-oriented programming; software metrics; specification languages; black box tool; flexible metric collection approach; generic language-agnostic object-oriented meta-model; high-level metric description language; language-specific construct; metric specification; object-oriented metric extraction framework; source code representation; third-party code; Automatic control; Computer languages; Costs; Data mining; Natural languages; Object oriented modeling; Process control; Programming; Software maintenance; Software quality; Metric extraction; meta-model.; object-oriented metrics; source code representation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Source Code Analysis and Manipulation, 2009. SCAM '09. Ninth IEEE International Working Conference on
  • Conference_Location
    Edmonton, AB
  • Print_ISBN
    978-0-7695-3793-1
  • Type

    conf

  • DOI
    10.1109/SCAM.2009.27
  • Filename
    5279926