Title :
ECC-on-SIMM test challenges
Author_Institution :
IBM Corp. Microelectron. Div, Essex Junction, VT
Abstract :
The typical personal computer of today is used more and more to perform functions and run application programs that are critical to a business´s success. One of the biggest problems that inhibits productivity in this environment Is the effect of a lock-up, crash or parity error caused by cosmic-ray radiation-induced soft errors in the DRAM chips. IBM has announced a family of plug-compatible, retrofittable SIMMs with built-in ECC to provide a solution to this problem. This paper addresses the challenges associated with the full functional test of a SIMM with on-board ECC using a very test-unfriendly industry-standard memory module interface
Keywords :
DRAM chips; IBM computers; error correction codes; fault diagnosis; radiation hardening (electronics); standards; DRAM chips; ECC; IBM; built-in ECC; cosmic-ray radiation-induced soft errors; crash; error correction code; functional test; industry-standard memory module interface; lock-up; on-board ECC; parity error; personal computer; plug-compatible retrofittable SIMM; productivity; run application programs; single inline memory module; Application specific integrated circuits; Circuit testing; Control systems; Glass manufacturing; Logic testing; Performance evaluation; Protection; Random access memory; Soldering; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527993
