DocumentCode :
1691546
Title :
TAB inner-lead bond process characterization for single-point laser bonding
Author :
Emamjomeh, Ali ; Wesling, Paul ; Doong, Jeff ; Chi, Alice ; Ling, Kathy ; Chiao, Sun
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
fYear :
1991
Firstpage :
21
Lastpage :
26
Abstract :
Results are presented for a set of screening experiments used to characterize a process for performing inner-lead bonding (ILB) using a continuous-wave (CW) laser. Three key parameters were selected for initial analysis: the force exerted by the bonding stylus; the laser power; and the on-time of the laser. Using a Box-Behnken statistical design for the experiment, an efficient set of tests was derived. Four sets of experimental samples were fabricated, to be used for the as-fabricated testing, high-temperature aging, and thermal cycling. Only the as-fabricated results are reported here. Using a design-of-experiments software package for the PC, a quadratic equation was derived from the data explicitly defining the relationships among the three parameters and relating them to bond strength. Using the techniques of surface response methodology, a response surface was created, showing the optimum operating region for the ILB process based on the parameter range chosen. The initial screening experiments show that good bond strength occurs in a range of constant energy (power times on-time) for the CW laser bonder; in the range of the three parameters tested, bond strength was optimized at forces of 20 grams, a power of 4.3 W, and laser on-time of 150 ms
Keywords :
laser beam applications; tape automated bonding; 150 ms; 4.3 W; Box-Behnken statistical design; CW laser bonder; ILB; TAB; as-fabricated testing; bond strength; bonding stylus; design-of-experiments software package; experimental samples; force; high-temperature aging; inner-lead bonding; laser bonding; laser power; on-time; optimum operating region; process characterization; process window; quadratic equation; response surface; screening experiments; set of tests; surface response methodology; thermal cycling; Application software; Bonding; Calibration; Circuit testing; Equations; Laser stability; Optical design; Power lasers; Response surface methodology; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0155-2
Type :
conf
DOI :
10.1109/IEMT.1991.279738
Filename :
279738
Link To Document :
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