An experimental verification of thermal simulation by WATAND for a bipolar RF power transistor

WATAND is the University of Waterloo´s interactive circuit simulation program for simulating the combined electrical and thermal behaviour of transistors. The authors report on a comparison between thermal mappings of bipolar RF power transistors obtained using WATAND simulation techniques on the one hand and using thermochromic liquid-crystal experimental techniques on the other. This comparison was carried out to test the accuracy of the WATAND modelling and simulation methods prior to using the simulation tool as a design aid in developing some ballasted RF devices.<>