Title :
Package warpage evaluation for multi-layer molded PQFP
Author :
Kiang, Bill ; Wittmershaus, Janice ; Kar, Rudra ; Sugai, Neil
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
Finite element analyses (FEAs) together with molding experimentation with various mold chases were conducted to evaluate the mechanisms for package warpage and leadframe deflection of multi-layer PQFP (plastic quad flat pack) packages. The leadframe downset structure is identified as the major factor contributing to the package warpage. It is demonstrated that package warpage can be eliminated by properly tailoring the top and bottom mold cavity depths. The post mold cure, which raises the Tg of the molding compound, also helps reduce the package warpage. FEA calculations of package warpage at room temperature are in good agreement with experimental data. The leadframe deflection is also due primarily to its downset structure and may be reduced by preheating the leadframe before the encapsulation
Keywords :
VLSI; encapsulation; finite element analysis; packaging; surface mount technology; FEA calculations; encapsulation; experimental data; fine pitch PQFP; finite element analysis; leadframe deflection; leadframe downset structure; leadframe preheating; mold cavity depths; mold chases; molding experimentation; multi-layer PQFP; multilayer PQFP; package warpage; plastic quad flat pack; post mold cure; room temperature; Components, packaging, and manufacturing technology; Cooling; Costs; Electronics packaging; Finite element methods; Land surface temperature; Material properties; Plastic packaging; Resins; Surface-mount technology;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0155-2
DOI :
10.1109/IEMT.1991.279753