• DocumentCode
    1692137
  • Title

    A 0.67nJ/S time-domain temperature sensor for low power on-chip thermal management

  • Author

    Young-Jae An ; Kyungho Ryu ; Dong Hoon Jung ; Seung-Han Woo ; Seong-Ook Jung

  • Author_Institution
    VLSI Syst. Lab., Yonsei Univ., Seoul, South Korea
  • fYear
    2013
  • Firstpage
    572
  • Lastpage
    573
  • Abstract
    This paper presents a time-domain temperature sensor with process variation tolerance for low power on-chip thermal management. To achieve a suitable on-chip composition, the proposed sensor uses the externally applied code to save the area- and power-consumption. The proposed sensor is implemented using a 0.13μm CMOS process technology and its core area is 0.031mm2. The measurement results show that the energy per conversion rate is 0.67nJ/S at 1.2V supply voltage, conversion rate is 430k samples/sec, and sensing error is -0.63 ~ +1.04°C with 2nd order master curve and one-point calibration over the temperature range of 20 ~ 120°C.
  • Keywords
    CMOS integrated circuits; calibration; low-power electronics; temperature sensors; thermal management (packaging); time-domain analysis; tolerance analysis; CMOS process technology; low power on-chip thermal management; on-chip composition; one-point calibration; power consumption; power saving; process variation tolerance; second order master curve; sensing error; size 0.13 mum; temperature 20 degC to 120 degC; time-domain temperature sensor; voltage 1.2 V; Calibration; Semiconductor device measurement; System-on-chip; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ICCE), 2013 IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2158-3994
  • Print_ISBN
    978-1-4673-1361-2
  • Type

    conf

  • DOI
    10.1109/ICCE.2013.6487022
  • Filename
    6487022