Title :
Detection and correction of systematic type I test errors through concurrent engineering
Author :
Kosar, William R.
Author_Institution :
Philips Semiconds., Albuquerque, NM, USA
Abstract :
Systematic Type I test errors in the integrated circuit production test environment are analyzed with an emphasis on wafer level test problems. Effective use of concurrent engineering procedures is shown to be a critical factor in the rapid detection and solution of these problems
Keywords :
concurrent engineering; error correction; error detection; integrated circuit testing; production testing; EPROM; UPROM; concurrent engineering; error correction; error detection; integrated circuit production test; systematic type I test errors; wafer level test; Capacitance; Circuit testing; Concurrent engineering; Costs; Design engineering; Error correction; History; Integrated circuit testing; Materials testing; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527996
