Title :
HALT: bridging the gap between theory and practice
Author :
Ascarrunz, Cheryl
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
Abstract :
Tandem Computers routinely uses HALT (highly accelerated life test) and ESS (environmental stress screening) strategies to develop more robust designs and achieve higher product quality. This paper discusses the development of this methodology and its widespread applicability to all companies
Keywords :
computer power supplies; computer testing; design for testability; environmental stress screening; environmental testing; life testing; logic testing; CPU X boards; ESS; HALT; Tandem Computers; environmental stress screening; highly accelerated life test; power supplies; product quality; robust designs; Costs; Electronic switching systems; Failure analysis; Frequency; Logic; Power supplies; Production; Robustness; Stress; Testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527998
