Title :
A new flip chip packaging technology for the mid-range application space
Author :
Pendse, Rajendra D. ; Kim, Kyung-Moon ; Tam, Samuel
Author_Institution :
ChipPAC Inc., Fremont, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
A new flip chip packaging technology is developed which entails fine pitch bumping and assembly of standard die with perimeter bonding pads. The technology provides compelling advantages for the packaging of ICs in the mid range application space (up to ∼700 pins) represented by devices such as ASICs, graphics processors, DSPs, RF/analog and others. The flip chip interconnection is accomplished by the use of gold stud bumps on the die, attached by thermocompression bonding to low-cost substrates with predispensed non-conductive adhesive (NCA) in lieu of conventional underfilling. In this paper, the structure, assembly process and reliability data of the package are presented. High levels of component level reliability are demonstrated, previously believed to be unfeasible with similar package structures. Extension of the interconnect technology to finer pitch and higher pin counts (50 μm pitch/1000 I/O) is discussed. Finally, the electrical design and routing methodology that simplifies the structure and layer count of the substrate over comparable area array solder bump substrate designs is presented.
Keywords :
adhesives; chip scale packaging; flip-chip devices; gold; integrated circuit bonding; integrated circuit interconnections; integrated circuit reliability; lead bonding; 50 micron; ASIC; Au; DSP; IC packaging; NCA; RF IC; analog IC; component level reliability; die perimeter bonding pads; fine pitch bumping; fine pitch interconnect technology; flip chip packaging technology; gold stud bumps; graphics processors; low-cost substrates; mid range application space; package assembly process; package pin count; package pin pitch; package reliability; package structure; predispensed nonconductive adhesive; solder bump substrates; standard die assembly; thermocompression bonding attachment; underfilling; Assembly; Bonding; Digital signal processing chips; Flip chip; Graphics; Packaging; Pins; Radio frequency; Space technology; Standards development;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008080