Title :
Nonlinear Dielectric Properties of (Ba0.60, Sr0.40)TiO3 Thin Films with Anisotropic Epitaxy
Author :
Akdogan, E. K. ; Simon, W.K. ; Safari, Abdolreza
Author_Institution :
Department of Materials Science & Engineering, Rutgers-The State University ofNew Jersey, 607 Taylor Road, Piscataway, NJ 08854. Fax: 732-445 5614 E-mail: eka@rci.rutgers.edu
Abstract :
Nonlinear dielectric response of (Ba0.60 Sr0.40)TiO3 epitaxial films on ≪100≫ and ≪110≫-oriented NdGaO3 substrates were investigated as a function of film thickness. The second, fourth and sixth order permittivities were determined at 10 GHz and at room temperature from which the so-called critical field for maximum tunability was computed using a thermodynamic formalism recently developed by the authors along the principal residual misfit strain directions. It is shown that the critical field is anisotropic in the plane of the film and its magnitudes are governed by the film thickness.
Keywords :
Anisotropic magnetoresistance; Binary search trees; Capacitive sensors; Dielectric substrates; Dielectric thin films; Fingers; Permittivity measurement; Pulsed laser deposition; Temperature; X-ray diffraction; BST; Critical field; Nonlinear dielectric; Thin films; Tunability;
Conference_Titel :
Applications of ferroelectrics, 2006. isaf '06. 15th ieee international symposium on the
Conference_Location :
Sunset Beach, NC, USA
Print_ISBN :
978-1-4244-1331-7
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2006.4349294