Title :
3.7 mΩ-cm2, 1500 V 4H-SiC DMOSFETs for advanced high power, high frequency applications
Author :
Ryu, Sei-Hyung ; Cheng, Lin ; Dhar, Sarit ; Capell, Craig ; Jonas, Charlotte ; Callanan, Robert ; Agarwal, Anant ; Palmour, John ; Lelis, Aivars ; Scozzie, Charles ; Geil, Bruce
Author_Institution :
Cree Inc., Durham, NC, USA
Abstract :
We present our most recent developments in 4H-SiC DMOSFETs. A 4H-SiC DMOSFET with an active area of 0.1 cm2 showed a specific on-resistance of 3.7 mΩ-cm2 with a gate bias of 20 V, and an avalanche voltage of 1500 V with gate shorted to source at 25°C. A threshold voltage of 3.5 V was extracted from the DMOSFET, and a subthreshold swing of 200 mV/dec was measured. The device was successfully scaled to an active area of 0.5 cm2, and the resulting device showed a drain current of 377 A at a forward voltage drop of 3.8 V at 25°C.
Keywords :
MOSFET; avalanche breakdown; electric potential; silicon compounds; wide band gap semiconductors; 4H-SiC DMOSFET; SiC; advanced high power applications; avalanche voltage; current 377 A; forward voltage drop; high frequency applications; temperature 25 degC; voltage 1500 V; voltage 20 V; voltage 3.5 V; Logic gates; Performance evaluation; Silicon carbide; Switches; Temperature; Temperature measurement; Threshold voltage;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-8425-6
DOI :
10.1109/ISPSD.2011.5890832