DocumentCode
1692869
Title
Interfacial reactions, microstructure and mechanical properties of Pb-free solder joints in PBGA laminates
Author
Kang, S.K. ; Choi, W.K. ; Shih, D.-Y. ; Lauro, P. ; Henderson, D.W. ; Gosselin, T. ; Leonard, D.N.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
146
Lastpage
153
Abstract
Sn-based alloys have been developed as Pb-free solder candidates to replace the Pb-containing solders used in microelectronic applications. However, their high Sn content and high melting point often cause excessive interfacial reactions, namely, dissolution of surface finish layers and concomitant formation of intermetallic compounds at the soldering interface. These interfacial reactions can therefore influence the microstructure and mechanical properties of the solder joints and eventually their reliability. The choice of a proper surface finish layer in printed circuit boards is an important issue in successfully introducing the Sn-based, Pb-free solders. The effects of surface finish layers and multiple reflows on the BGA solder joints have been investigated. A Pb-free solder alloy, Sn-Ag-Cu has been employed as the solder ball material. Five types of surface finish on opposite sides of the BGA balls, have been investigated. Intermetallic compound formation was measured as a function of reflow cycle. The effects of the interfacial reactions on the microstructure and mechanical properties of the solder joints were also investigated as a function of surface finish and reflow cycle.
Keywords
ball grid arrays; circuit reliability; dissolving; plastic packaging; printed circuit manufacture; reflow soldering; surface treatment; PBGA laminates; Sn-Ag-Cu; dissolution; interfacial reactions; intermetallic compounds; mechanical properties; melting point; multiple reflows; printed circuit boards; reflow cycle; reliability; solder ball material; surface finish layers; Assembly; Gold; Intermetallic; Mechanical factors; Microelectronics; Microstructure; Soldering; Surface finishing; Temperature; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008088
Filename
1008088
Link To Document