Successful yield ramp using product test, scan and memory diagnosis

Author

Muthumalai, Venkatesan ; Iverson, David ; Sinnott, Aaron ; Desineni, Rao ; Turakhia, Ritesh ; Berndt, Thomas ; Bell, Nancy

Author_Institution

GLOBALFOUNDRIES Inc., Malta, NY, USA

fYear

2014

fDate

19-21 May 2014

Firstpage

1

Lastpage

4

Abstract

Fast yield ramp is very important for a foundry during advanced process development and volume production. Logic and SRAM circuits are the major design blocks in advanced Integrated Circuits. Identification of systematic failures in logic and SRAM blocks using product test and diagnostics is critical to increasing the speed of yield learning in sub-40nm ICs. This paper highlights the importance of using logic and SRAM diagnosis for product yield ramp using three yield breakthroughs.

Keywords

SRAM chips; integrated circuit testing; integrated circuit yield; logic circuits; SRAM blocks; SRAM circuits; advanced integrated circuits; advanced process development; logic blocks; logic circuits; memory diagnosis; product test; scan diagnosis; size 40 nm; systematic failure identification; volume production; yield ramp; Failure analysis; Foundries; Random access memory; Sensitivity; System-on-chip; Systematics; Yield ramp; chain instance analysis; memory instance analysis; volume diagnostics;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI

Conference_Location

Saratoga Springs, NY

Type

conf

DOI

10.1109/ASMC.2014.6846945

Filename

6846945