• DocumentCode
    169327
  • Title

    DiagBridge: Analyzing scan diagnosis data in a yield perspective

  • Author

    Yan Pan ; Chittora, Anshu ; Sekar, K. ; Malik, S. ; Keat, Lim Seng

  • Author_Institution
    GLOBALFOUNDRIES Inc., Malta, NY, USA
  • fYear
    2014
  • fDate
    19-21 May 2014
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    In this work, we described a powerful volume diagnosis and yield analysis framework called DiagBridge. DiagBridge enhances volume diagnosis results with sort and design data so as to present the volume diagnosis results in easy-to-understand metrics like yield loss estimation and failure rate estimation. We are already sharing these results with cross-functional teams and seeing various functional teams taking corrective actions to improve yield and reduce yield-limiting factors. Such systems further enables straight-forward comparisons and significantly improves the efficiency in logic yield ramping.
  • Keywords
    failure analysis; integrated circuit yield; logic circuits; logic testing; DiagBridge; failure rate estimation; logic yield ramping; scan diagnosis data; volume diagnosis; yield analysis framework; yield loss estimation; Computer architecture; Estimation; Failure analysis; Measurement; Sociology; Standards; Statistics; failure analysis; scan diagnosis; volume diagnosis; yield loss pareto; yield ramp;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • Type

    conf

  • DOI
    10.1109/ASMC.2014.6846948
  • Filename
    6846948