Title :
Understanding and Solving Flip-Ambiguity in Network Localization via Semidefinite Programming
Author :
Severi, Stefano ; Abreu, Giuseppe ; Destino, Giuseppe ; Dardari, Davide
Author_Institution :
Dipt. di Elettron. Inf. e Sist., Univ. degli Studi di Bologna, Cesena, Italy
Abstract :
We employ the semidefinite programming (SDP) framework to first analyze, and then solve, the problem of flip-ambiguity afflicting range-based network localization algorithms with incomplete ranging information. First, we study the occurrence of flip-ambiguous nodes and errors due to flip ambiguity by considering random network topologies with successively smaller connectivity ranges RMax > RMax - ¿R > ¿ > RU > RL, and employing an SDP-based unique localizability test to detect the limiting connectivity ranges RU and RL that are respectively sufficient and un-sufficient to ensure unique localizability. Then, we utilize this information to construct an SDP formulation of the localization problem with Genie-aided constraints, which is shown to resolve flip-ambiguities. Finally, we derive a flip-ambiguity-robust network localization algorithm by relaxing the Genie-aided constraints onto feasible alternatives. Finally, the performance of the so-obtained localization algorithm is studied by Monte-Carlo simulations, which reveal a substantial improvement over the conventional SDP-based algorithm.
Keywords :
Monte Carlo methods; linear programming; mobile computing; mobility management (mobile radio); Genie-aided constraints; Monte-Carlo simulations; SDP framework; SDP-based unique localizability test; flip ambiguity solution; flip-ambiguity-robust network localization algorithm; flip-ambiguous nodes; network localization; range-based network localization algorithms; semidefinite programming; Algorithm design and analysis; Concrete; Information analysis; Instruments; Monte Carlo methods; Network topology; Optimization methods; Testing; Wireless communication; Yield estimation;
Conference_Titel :
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-4148-8
DOI :
10.1109/GLOCOM.2009.5425849