• DocumentCode
    1693381
  • Title

    Analysis of non-uniform sampling effects in sigma-delta modulated signals

  • Author

    Lee, Eel-Wan ; Chae, Soo- Ik

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., South Korea
  • Volume
    1
  • fYear
    1998
  • Firstpage
    377
  • Abstract
    The effects of non-uniform sampling in the ΣΔ-modulated DAC are discussed in this paper. The non-uniform sampling of the ΣΔ-modulated signals causes in-band noise in the DAC, which will be compared with the harmonic distortions in switched capacitor circuit and the that due to the signal-dependent nonlinearity in the 1-bit DAC. We describe an error-driven edge selection algorithm that suppresses the in-band noise and its implementation. We also propose a model of the in-band noise caused by the non-uniform sampling, which predicts the noise reduction of the spectral shaping in the frequency domain quantitatively based upon the transition probability of the modulator output
  • Keywords
    circuit noise; digital-analogue conversion; sigma-delta modulation; signal sampling; DAC; error-driven edge selection algorithm; in-band noise; nonuniform sampling; sigma-delta modulation; spectral shaping; transition probability; Circuit noise; Clocks; Delta-sigma modulation; Frequency; Linearity; Noise reduction; Noise shaping; Phase locked loops; Sampling methods; Signal analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-4455-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1998.704445
  • Filename
    704445