Title :
SAT-Based On-Line Fault Isolation in Serial Systems
Author :
Jeon, Jinseong ; Kim, Sangwon ; Lee, Dongkeun
Author_Institution :
Agency for Defense Dev., Seoul, South Korea
Abstract :
We introduce a method to isolate faults at run-time in an embedded system whose components form a matrix structure. Our method probes a system via test paths a SAT-solver recommends, feeding the SAT-solver with the encodings for test path conditions and the current status of the system. After receiving test results, the SAT-solver recommends another test path suitable for the situation. We can detect all defects by checking the system until the SAT-solver does not make any useful suggestions. Our SAT-based fault diagnosis ensures termination and conducts only essential inspections without misses of potential flaws.
Keywords :
computability; embedded systems; fault diagnosis; program testing; SAT-solver; fault diagnosis; online fault isolation; serial systems; Built-in self-test; Detectors; Embedded system; Encoding; Fault diagnosis; Probes; Radio frequency; Runtime; Signal design; System testing; Fault Isolation; SAT-solver; Test Path;
Conference_Titel :
Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4862-3
Electronic_ISBN :
978-0-7695-3774-0
DOI :
10.1109/VALID.2009.9