• DocumentCode
    1693445
  • Title

    An integrated approach to process monitoring and data analysis

  • Author

    Wong, K.Y. ; Daudenarde, J.J. ; Yeh, C.S. ; Cheung, I. ; Ruble, E. ; Rabier, G.

  • Author_Institution
    IBM Almaden Res. Center, San Jose, CA, USA
  • fYear
    1991
  • Firstpage
    391
  • Lastpage
    394
  • Abstract
    The authors describe two architectures: the Automated Process Monitoring (APROM) System, which examines a large combination of trend charts and shows the symptoms of problems to the engineers by sending a high level message and a chart when a process variable is out of control; and the Interactive Data Extraction and Analysis (IDEA) System, which provides a simple menu interface to get a block of data from a local, or remote host database. Once the user receives the right data block, the user can interactively exercise many options of plots and statistical data analysis functions. An application is described by a profile which can be modified easily by users
  • Keywords
    computerised monitoring; quality control; statistical analysis; statistical process control; APROM; Automated Process Monitoring; Interactive Data Extraction and Analysis; data analysis; data block; menu interface; process monitoring; process variable; statistical analysis; trend charts; Automatic control; Computerized monitoring; Control charts; Control systems; Data analysis; Data mining; Databases; Magnetic heads; Manufacturing processes; Process control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-0155-2
  • Type

    conf

  • DOI
    10.1109/IEMT.1991.279822
  • Filename
    279822