DocumentCode :
1693636
Title :
Reverse Engineering and Testing Service Life Cycles of Mobile Platforms
Author :
Franke, Dominik ; Elsemann, Corinna ; Kowalewski, Stefan
Author_Institution :
Embedded Software Lab., Aachen, Germany
fYear :
2012
Firstpage :
16
Lastpage :
20
Abstract :
Using services on mobile devices for time- and safety-critical applications, like abnormal situation or disaster management, requires a high availability and reliability of the services. To fulfill these quality requirements, a well-understood, -defined and tested life cycle management of the services during runtime is necessary. Understanding service life cycles is crucial, since an insufficient life cycle implementation leads to undesired behavior and data loss. The first part of this paper presents how to reverse engineer the service life cycles of mobile platforms. The second part applies life cycle test approaches from mobile applications to services. The results show how the similarities between mobile application and service life cycles on mobile platforms can be used to develop and apply the same concepts and tools with few modifications for both worlds.
Keywords :
mobile computing; program testing; reverse engineering; safety-critical software; software quality; software reliability; software reusability; abnormal situation; data loss; disaster management; life cycle management; mobile devices; mobile platforms; reverse engineering; safety-critical applications; service availability; service life cycle testing; service reliability; software quality; time-critical applications; Androids; Humanoid robots; Mobile communication; Reliability; Reverse engineering; Smart phones; Testing; life cycle; mobile; reverse engineering; service; software quality; testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Database and Expert Systems Applications (DEXA), 2012 23rd International Workshop on
Conference_Location :
Vienna
ISSN :
1529-4188
Print_ISBN :
978-1-4673-2621-6
Type :
conf
DOI :
10.1109/DEXA.2012.40
Filename :
6327397
Link To Document :
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