Title :
A passive reduced rating output rectifier snubber for plasma cutting power supply
Author :
Kamath, Girish R.
Author_Institution :
Hypertherm, Inc., Hanover, NH, USA
Abstract :
R-C snubber circuits are used to absorb the reverse recovery energy of a rectifier diode and limit the associated voltage spike across it as presented by MacMurray (1972). This circuit, while being simple and reliable is unsuitable for applications with power levels above 10 kW due to its high power dissipation. Existing alternatives efficiently recycle the diode reverse recovery energy into the load. However, these suffer from drawbacks such as excessive diode voltage stress or circuit complexity. This paper proposes a reduced rating diode snubber that limits the diode voltage stress over the entire load operating range while keeping the snubber power dissipation to a minimum. A simple circuit model is simulated to evaluate its operation over the entire power supply operating range. It is first experimentally verified with a proof-of-concept 7 kW prototype. Experimental results show a 60 % reduction in power dissipation in addition to a 30 % reduction in diode voltage overshoot when compared with the conventional R-C snubber under nominal operating conditions. Further experimentation with a 100 A, 150 V plasma cutting power supply shows that the output rectifier voltage stress is kept within reasonable limits over a wide load operating range verifying the robustness of the proposed circuit.
Keywords :
circuit complexity; passive networks; power supply circuits; rectifiers; snubbers; 100 A; 150 V; 7 kW; R-C snubber circuits; circuit complexity; circuit model; circuit robustness; diode reverse recovery energy; diode voltage stress limit; excessive diode voltage stress; high power dissipation; output rectifier snubber; passive rectifier snubber; plasma cutting power supply; rectifier diode; reduced rating rectifier snubber; voltage spike across; Circuits; Diodes; Plasma applications; Power dissipation; Power supplies; Rectifiers; Recycling; Snubbers; Stress; Voltage;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2006. APEC '06. Twenty-First Annual IEEE
Print_ISBN :
0-7803-9547-6
DOI :
10.1109/APEC.2006.1620520