Title :
Rician noise removal on MRI using wave atom transform with histogram based noise variance estimation
Author :
Rajeesh, J. ; Moni, R.S. ; Kumar, S. Palani ; Gopalakrishnan, T.
Author_Institution :
Dept. of ECE, Noorul Islam Coll. of Eng., Kumaracoil, India
Abstract :
Wave atom transform is a new multi-resolution technique, which has the ability to adapt to arbitrary local directions of a pattern, and to sparsely represent anisotropic patterns aligned with the axes. In this paper, a de-noising technique is proposed to remove the rician noise from Magnetic Resonance Images using wave atom shrinkage. It is well known that the noise in magnetic resonance imaging has a Rician distribution. Unlike additive Gaussian noise, Rician noise is signal dependent, and separating signal from noise is a difficult task. De-noising by any shrinkage technique is highly sensitive to the threshold selection. Here to estimate the noise variance, histogram based technique is used and to calculate the shrinkage threshold a new technique is adapted. This method is applied to both simulated images and real images and is compared with wavelet shrinkage.
Keywords :
Gaussian noise; biomedical MRI; enhanced magnetoresistance; image denoising; image resolution; image segmentation; medical image processing; wavelet transforms; Gaussian noise; Rician distribution; Rician noise removal; anisotropic pattern; denoising technique; histogram based noise variance estimation; histogram based technique; magnetic resonance imaging; multiresolution technique; simulated image; threshold selection; wave atom transform; wavelet shrinkage; Estimation; Magnetic resonance; Magnetic resonance imaging; Noise; Noise reduction; Rician channels; Transforms; De-noising; Histogram; Magnetic Resonance Image; Rician Noise; Variance Estimation; Wave Atom Transform;
Conference_Titel :
Communication Control and Computing Technologies (ICCCCT), 2010 IEEE International Conference on
Conference_Location :
Ramanathapuram
Print_ISBN :
978-1-4244-7769-2
DOI :
10.1109/ICCCCT.2010.5670609