DocumentCode :
1693816
Title :
Influence of moisture absorption in uncured underfill materials
Author :
Luo, Shijian ; Wong, C.P.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
390
Lastpage :
397
Abstract :
Underfill is used to fill the gap between the integrated circuit (IC) chip and the substrate to improve the solder joint fatigue life in a flip chip package. In order to improve underfilling process, wafer level underfill materials are being developed. Wafer level underfill materials will be applied onto silicon wafer, B-staged, and then individual chips are diced. A certain time later, the individual underfill coated chip is attached onto substrate and underfill is cured during assembly. Most underfills are based on epoxy cured with different hardeners. However, uncured or incompletely cured epoxy underfill can absorb moisture in the normal environment. This will be an important concern for wafer level underfill materials. This paper will present a systematic study on moisture absorption in uncured underfill based on epoxy cured with acid anhydride (methylhexahydrophthalic anhydride, MHHPA) and epoxy cured with non-acid anhydride curing agent. The influence of absorbed moisture on curing properties, thermomechanical property, and adhesion property of underfill after curing was investigated.
Keywords :
adhesion; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; moisture; acid anhydride; adhesion property; curing properties; flip chip package; moisture absorption; nonacid anhydride curing agent; solder joint fatigue life; thermomechanical property; uncured underfill materials; underfilling process; wafer level underfill materials; Absorption; Assembly; Curing; Fatigue; Flip chip; Integrated circuit packaging; Moisture; Silicon; Soldering; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008126
Filename :
1008126
Link To Document :
بازگشت