DocumentCode :
1693858
Title :
Double-layer no-flow underfill materials and process
Author :
Zhang, Zhuqing ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
404
Lastpage :
410
Abstract :
No-flow underfill has been invented and practised in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. CSP components are assembled using the double-layer no-flow underfill process. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. With high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation.
Keywords :
chip scale packaging; design of experiments; encapsulation; flip-chip devices; reflow soldering; reliability; thermal expansion; viscosity; CSP components; SiO2; coefficient of thermal expansion; design of experiment; double-layer no-flow underfill; flip-chip process; reflow profile; reliability; silica fillers; solder joint formation; solder wetting properties; underfill thickness; underfill viscosity; Assembly; Curing; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; Viscosity; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008128
Filename :
1008128
Link To Document :
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