DocumentCode :
1693883
Title :
A novel method of measuring inherent power system charging current
Author :
Paul, Dev ; Sutherland, Peter E. ; Panetta, Sergio
Author_Institution :
AECOM, Oakland, CA, USA
fYear :
2011
Firstpage :
1
Lastpage :
9
Abstract :
High-Resistance grounded (HRG) power systems have been used in many industries to minimize equipment damage, including, but not limited to mining, petrochemicals, shore-to-ship power supplies and many others. The system charging current value should be known for designing a HRG power system. One method of determining the system charging current is to perform engineering calculations involving the inherent capacitance to ground for each of the power system components. However, this method may not provide accurate data as the sneak capacitance to ground for power system components cannot be determined due to their installation configuration. Therefore, it is essential to have a reliable method of measuring the system charging current. Before describing the proposed method of measuring the system charging current, fundamental concepts of system charging currents and mathematical analysis are provided. In addition, power system arcing faults and the associated damage when a fault remains line-ground faulted, especially in case of a medium voltage power system, is included. Finally, a novel and suitable method of measuring the inherent power system charging current is proposed.
Keywords :
earthing; mathematical analysis; power system protection; engineering calculations; high-resistance grounded power systems; mathematical analysis; mining; petrochemicals; power system charging current; power system components; shore-to-ship power supplies; Equations; Fault currents; Fault location; Heating; Integrated circuits; Power systems; Resistors; Arc-hazard; capacitance-to-ground; charging current; grounded power system; high-resistance grounded; ungrounded power system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial and Commercial Power Systems Technical Conference (I&CPS), 2011 IEEE
Conference_Location :
Baltimore, MD
ISSN :
2158-4893
Print_ISBN :
978-1-4244-9999-1
Type :
conf
DOI :
10.1109/ICPS.2011.5890880
Filename :
5890880
Link To Document :
بازگشت