• DocumentCode
    1693964
  • Title

    Study and modeling of the curing behavior of no-flow underfill

  • Author

    Zhang, Zhuqing ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    432
  • Lastpage
    438
  • Abstract
    Starting with a promising no-flow underfill formulation, this paper seeks to develop a systematic methodology to study and model its curing behavior. A Differential Scanning Calorimeter (DSC) is used to characterize the heat flow during curing under isothermal and temperature ramp conditions. A modified autocatalytic model is developed with temperature-dependent parameters. The Degree of Cure (DOC) is calculated; compared with DSC experiments, the model gives a good prediction of DOC under different curing conditions. The temperature of the printed wiring board (PWB) during solder reflow is measured using thermocouples and the evolution of DOC of the no-flow underfill during a reflow process is calculated and compared with experimental results. A rheometer and a Fourier-Transform Infrared (FTIR) spectroscope are used to study the relation of the underfill gelation with the reaction mechanism. Rapid heating rate favors the etherification of the epoxy over the esterification between the epoxy and the anhydride. This causes the early gelation of the underfill.
  • Keywords
    differential scanning calorimetry; flip-chip devices; polymers; printed circuit manufacture; reflow soldering; spectrochemical analysis; viscosity; DSC; FTIR spectroscope; PWB temperature; curing behavior; degree of cure; early gelation; epoxy etherification; flip-chip process; heat flow; isothermal conditions; modified autocatalytic model; no-flow underfill; printed wiring board; rapid heating rate; reaction mechanism; rheometer; solder reflow; systematic methodology; temperature ramp conditions; temperature-dependent parameters; thermocouples; underfill gelation; Curing; Delay; Materials science and technology; Packaging; Resins; Semiconductor device modeling; Soldering; Temperature; Thermal stresses; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008132
  • Filename
    1008132