DocumentCode
1693964
Title
Study and modeling of the curing behavior of no-flow underfill
Author
Zhang, Zhuqing ; Wong, C.P.
Author_Institution
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
432
Lastpage
438
Abstract
Starting with a promising no-flow underfill formulation, this paper seeks to develop a systematic methodology to study and model its curing behavior. A Differential Scanning Calorimeter (DSC) is used to characterize the heat flow during curing under isothermal and temperature ramp conditions. A modified autocatalytic model is developed with temperature-dependent parameters. The Degree of Cure (DOC) is calculated; compared with DSC experiments, the model gives a good prediction of DOC under different curing conditions. The temperature of the printed wiring board (PWB) during solder reflow is measured using thermocouples and the evolution of DOC of the no-flow underfill during a reflow process is calculated and compared with experimental results. A rheometer and a Fourier-Transform Infrared (FTIR) spectroscope are used to study the relation of the underfill gelation with the reaction mechanism. Rapid heating rate favors the etherification of the epoxy over the esterification between the epoxy and the anhydride. This causes the early gelation of the underfill.
Keywords
differential scanning calorimetry; flip-chip devices; polymers; printed circuit manufacture; reflow soldering; spectrochemical analysis; viscosity; DSC; FTIR spectroscope; PWB temperature; curing behavior; degree of cure; early gelation; epoxy etherification; flip-chip process; heat flow; isothermal conditions; modified autocatalytic model; no-flow underfill; printed wiring board; rapid heating rate; reaction mechanism; rheometer; solder reflow; systematic methodology; temperature ramp conditions; temperature-dependent parameters; thermocouples; underfill gelation; Curing; Delay; Materials science and technology; Packaging; Resins; Semiconductor device modeling; Soldering; Temperature; Thermal stresses; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008132
Filename
1008132
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