Fault location in passive analog RC circuits by measuring impulse response

In this paper modified impulse response estimation method is described. After recalling the general problems of automatic symbolic function generation, and a basis of impulse response estimation method, expanding of this method is proposed. This paper deals with fault location of single fault in analog electronic circuits. In the paper, an example of this approach is given. Finally, the utility of this method when two faults occured in a circuit is considered