Title :
Advancement of microelectronics-grade carbon nanotube materials for NRAM® device manufacture
Author :
Lamb, James E. ; Gibbons, Stephen ; Yongqing Jiang ; Mangelson, Kay ; Kremer, Kathryn ; Janzen, Dan ; Bledsoe, John ; Boeser, Mathew
Author_Institution :
Carbon Electron. Center, Brewer Sci., Inc., Springfield, MO, USA
Abstract :
This work focuses on the development of electronics-grade carbon nanotube (CNT) formulations for commercialization of CNT-based memory devices. Preparing and providing these critical materials is key to empowering innovation and tapping the potential promised for CNT memory device technologies. This paper will review the quality improvements made by Brewer Science in the development of its third-generation CNT materials, which demonstrate a 10X increase in CNT concentration with a 5X reduction in metal ion content in non-surfactant, aqueous, room-temperature-stable formulations. To provide an integrated solution for CNT memory, these improvements are needed to reduce material consumption and overall processing time and cost. However, increased CNT concentration leads to loss of shelf life stability of the formulations and increases the concentrations of metal ions that must be removed. Both the development and characterization of analytical tests with wafer validation testing will be reviewed. Critical parameters, device architecture, and array performance results for CNT memory device in a 130-nm, 4-MB memory device is also reviewed.
Keywords :
carbon nanotubes; random-access storage; semiconductor device manufacture; CNT concentration; CNT memory device technologies; NRAM device manufacture; metal ion content; microelectronics-grade carbon nanotube materials; room-temperature-stable formulations; shelf life stability; size 130 nm; storage capacity 4 Mbit; third-generation CNT materials; wafer validation testing; Coatings; Computer architecture; Materials; Metals; Microprocessors; Performance evaluation; Random access memory; CNT; carbon nanotubes; electronics grade; embedded memory; nanotube memory; semiconductor grade;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI
Conference_Location :
Saratoga Springs, NY
DOI :
10.1109/ASMC.2014.6847008