DocumentCode
1694887
Title
Invited Talk 2
Author
Natarajan, Sriraam
Author_Institution
TSMC, Taiwan
fYear
2009
Abstract
Summary form only given. The complexity of today´s applications makes design and scaling of technology ever increasingly difficult and very challenging. The challenges are not just from scaling and improving the performance but also with the increased integration density of devices on a SoC and enabling complex functions. Newer memory technologies need to address to improve the integration density with a smaller bit cell, as well as increasing performance, reduced leakage, increased endurance (longer life cycle) and lower active currents. Many new memory technologies have been around for a long time but none seems to have taken mainstream compared to SRAMs, DRAMs or Flash. This talk will address some of the challenges in the newer memory technologies that are evolving, and discuss the requirements of the various applications that can adopt these emerging memory technologies.
Keywords
digital storage; integrated circuit design; system-on-chip; DRAM; Flash; SRAM; SoC; active currents; endurance; integration density; memory technologies; reduced leakage; technology design; technology scaling;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location
Hsinchu
Print_ISBN
978-0-7695-3797-9
Type
conf
DOI
10.1109/MTDT.2009.28
Filename
5280064
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