DocumentCode :
1695222
Title :
Flip chip molding - highly reliable flip chip encapsulation
Author :
Braun, T. ; Becker, K.-F. ; Koch, M. ; Bader, V. ; Aschenbrenner, R. ; Reichl, H.
Author_Institution :
Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
717
Lastpage :
725
Abstract :
Flip chip technology has the shortest interconnect length for minimum signal disturbance and simultaneous interconnection leading to reduced process times especially for high I/O counts and for RF applications. Flip chip technology allows for reliabilities required for automotive applications, but to achieve this goal, a plastic encapsulant, the so called underfiller, has to be used. New material developments for transfer molding allow underfilling and overmolding in one single transfer molding step. Existing standard equipment for encapsulation can be used and no additional process step for underfill dispensing is required. Molded flip chips have the potential of high reliability as the low CTE of the flip chip molding compound reduces the thermal mismatch. State of the art in FC molding is the encapsulation of single chip packages as BGA or CSP. Trends of the market drive towards SIPs with an integration of different devices as e.g. SMD and FC. Therefore the highly reliable encapsulation of these hybrid packages with inhomogeneous topography is the future goal. For the qualification of flip chip molding a test vehicle has been designed at Fraunhofer IZM. This test vehicle for process evaluation allows the encapsulation and underfilling of a single flip chip.
Keywords :
ball grid arrays; chip scale packaging; encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; moulding; production testing; thermal expansion; BGA; CSP; CTE; Fraunhofer IZM; SIPs; encapsulation; flip chip encapsulation; flip chip molding; inhomogeneous topography; interconnect length; overmolding; process times; reliabilities; simultaneous interconnection; thermal mismatch; transfer molding; underfilling; Automotive applications; Encapsulation; Flip chip; Packaging; RF signals; Radio frequency; Signal processing; Testing; Transfer molding; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008177
Filename :
1008177
Link To Document :
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