DocumentCode :
1695294
Title :
Author index
fYear :
2009
Firstpage :
95
Lastpage :
95
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location :
Hsinchu
Print_ISBN :
978-0-7695-3797-9
Type :
conf
DOI :
10.1109/MTDT.2009.32
Filename :
5280080
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1695294
