DocumentCode :
1695481
Title :
Fault detection for chemical process based on improved MSPCA
Author :
Xia, L.-Y. ; Pan, H.-T. ; Cai, Y.-J. ; Sun, X.-F. ; Yu, Li
fYear :
2010
Firstpage :
5620
Lastpage :
5623
Abstract :
An improved multi-scale principal component analysis (MSPCA) is used for fault detection and diagnosis. Improved MSPCA simultaneously extracts both, cross correlation across the variable (principal component analysis (PCA) approach) and auto-correlation within a variable (wavelet approach). The data collected from the industry condition are processed by means of the nonlinear wavelet threshold denoising method. Using wavelets, the individual variable are decomposed into approximations and details at different scales. Contributions from each scale are collected in separate matrices, and a PCA model is then constructed to extract correlation at each scale. According to the analysis of simulation of chemical process, and comparing the improved MSPCA with MSPCA, it shows that the improved MSPCA has enhanced the accuracy of fault detection in process monitoring.
Keywords :
approximation theory; chemical engineering; fault location; principal component analysis; process monitoring; wavelet transforms; approximations; auto-correlation; chemical process; cross correlation across; fault detection; fault diagnosis; improved MSPCA; improved multiscale principal component analysis; industry condition; matrices; nonlinear wavelet threshold denoising method; process monitoring; Chemical engineering; Chemical processes; Fault detection; Fault diagnosis; Monitoring; Noise reduction; Principal component analysis; MSPCA; chemical process; denoising; fault detection; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location :
Jinan
Print_ISBN :
978-1-4244-6712-9
Type :
conf
DOI :
10.1109/WCICA.2010.5554749
Filename :
5554749
Link To Document :
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