Title :
A method for characterizing resistive and dielectric materials in VHF using the detection by integration principle
Author :
Halheit, Houda ; Haraoubia, B.
Author_Institution :
Hybrid Microelectron. Lab., Electron. Inst., Algiers, Algeria
fDate :
6/21/1905 12:00:00 AM
Abstract :
This paper describes a simple and new process for characterization of resistive and dielectric materials in VHF range. We have developed a computer program which permits to simulate the analogical function used in detection by integration measurement. The obtained results show a good measurement accuracy comparing to the analogical method
Keywords :
dielectric materials; dielectric measurement; microwave measurement; VHF measurement; computer simulation; dielectric material; integration detection; resistive material; Capacitors; Conductors; Couplers; Dielectric materials; Dielectric measurements; Frequency measurement; Material properties; Permittivity; Phase detection; Testing;
Conference_Titel :
High Power Microwave Electronics: Measurements, Identification, Applications, 1999. MIA-ME '99. Proceedings of the IEEE-Russia Conference
Conference_Location :
Novosibirsk
Print_ISBN :
5-7782-0270-9
DOI :
10.1109/MIAME.1999.827802
