DocumentCode
1695639
Title
A method for characterizing resistive and dielectric materials in VHF using the detection by integration principle
Author
Halheit, Houda ; Haraoubia, B.
Author_Institution
Hybrid Microelectron. Lab., Electron. Inst., Algiers, Algeria
fYear
1999
fDate
6/21/1905 12:00:00 AM
Abstract
This paper describes a simple and new process for characterization of resistive and dielectric materials in VHF range. We have developed a computer program which permits to simulate the analogical function used in detection by integration measurement. The obtained results show a good measurement accuracy comparing to the analogical method
Keywords
dielectric materials; dielectric measurement; microwave measurement; VHF measurement; computer simulation; dielectric material; integration detection; resistive material; Capacitors; Conductors; Couplers; Dielectric materials; Dielectric measurements; Frequency measurement; Material properties; Permittivity; Phase detection; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High Power Microwave Electronics: Measurements, Identification, Applications, 1999. MIA-ME '99. Proceedings of the IEEE-Russia Conference
Conference_Location
Novosibirsk
Print_ISBN
5-7782-0270-9
Type
conf
DOI
10.1109/MIAME.1999.827802
Filename
827802
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