Ultra hi-speed pin-electronics and test station using GaAs IC

Author

Sekino, Takashi ; Okayasu, Toshiyuki

Author_Institution

Advantest Corp., Saitama, Japan

fYear

34608

Firstpage

683

Lastpage

690

Abstract

This paper describes the pin-electronics technique applied in a high speed/high pin count test head which targets testing quarter micron high speed CMOS VLSI devices. The pin-electronics operate up to 1 GHz with the following characteristics; timing error<20 ps, rise/fall time<200 ps, minimum pulse width<500 ps, output voltage range -2.0 V to 3.5 V and output voltage amplitude =3.5 V. This was achieved by reducing to 1/5 the GaAs specific problem of changing gain in the low frequency range. The pin-electronics were implemented as a Driver Comparator Multichip Module in order to achieve a high pin count test head (1280 pins max)

Keywords

CMOS integrated circuits; III-V semiconductors; comparators (circuits); driver circuits; gallium arsenide; integrated circuit testing; multichip modules; very high speed integrated circuits; -2 to 3.5 V; 1 GHz; 200 ps; 3.5 V; CMOS VLSI; Driver Comparator Multichip Module; GaAs; GaAs IC; high speed/high pin count test head; minimum pulse width; output voltage amplitude; output voltage range; pin-electronics; rise/fall Time; test station; timing Error; ultrahigh speed pin-electronics; CMOS integrated circuits; Frequency; Gallium arsenide; High speed integrated circuits; Integrated circuit testing; Multichip modules; Space vector pulse width modulation; Timing; Very large scale integration; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1994. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2103-0

Type

conf

DOI

10.1109/TEST.1994.528014

Filename

528014