• DocumentCode
    1696354
  • Title

    Volumetric integral equations for non-uniform impurities in the rectangular waveguide

  • Author

    Davidovich, M.V. ; Popova, N.F.

  • Author_Institution
    Central Res. Inst. of Meas. Equip., Saratov State Tech. Univ., Russia
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Abstract
    Surface Integral Equations (SIEs) and Volumetric Integral Equations (VIEs) are widely used for solutions of electromagnetic boundary problems. The SIEs are convenient because they reduce the dimension of a problem (three-dimensional problems are reduced to two-dimensional SIEs) and allow all boundary and radiating conditions to be satisfied. Both the SIEs with the kernels as single- and double-layered potentials and the VIEs versus the electrical field distribution in the volume of an impurity, are known and have been used. In this paper the VIEs without surface integrals are developed for arbitrary dielectric and magnetic inclusions in the Rectangular Waveguide (RW). The goal of the paper is to elaborate the algorithms for solutions of boundary problems with arbitrary shaped inclusions and with arbitrary tensor permittivities and permeabilities (including bianisotropic ones). The method is based on piece-wise field approximations
  • Keywords
    Green´s function methods; boundary integral equations; rectangular waveguides; waveguide theory; arbitrary shaped inclusions; arbitrary tensor permeabilities; arbitrary tensor permittivities; dielectric inclusions; electromagnetic boundary problems; magnetic inclusions; nonuniform impurities; nonuniform inclusions; piecewise field approximations; rectangular waveguide; volumetric integral equations; Dielectrics; Electromagnetic radiation; Electromagnetic waveguides; Impurities; Integral equations; Kernel; Permittivity; Rectangular waveguides; Surface waves; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Power Microwave Electronics: Measurements, Identification, Applications, 1999. MIA-ME '99. Proceedings of the IEEE-Russia Conference
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    5-7782-0270-9
  • Type

    conf

  • DOI
    10.1109/MIAME.1999.827835
  • Filename
    827835