DocumentCode
1696375
Title
Achieving ±30 ps accuracy in the ATE environment
Author
Petrich, Dennis
Author_Institution
Wave Technol. Corp., Santa Clara, CA, USA
fYear
34608
Firstpage
691
Lastpage
700
Abstract
This paper deals with solving the problems of interfacing existing ATE to external time measurement instruments for making propagation delay and jitter measurements with accuracies of ±30 ps, jitter <5 ps for testing PLL, LAN/Telecom devices
Keywords
SPICE; automatic test equipment; integrated circuit testing; jitter; local area networks; peripheral interfaces; phase locked loops; telecommunication equipment testing; timing; 5 ps; ATE environment; LAN/Telecom devices; PLL; external time measurement instruments; interfacing; jitter measurements; propagation delay; Clocks; Distortion measurement; Instruments; Jitter; Manufacturing; Phase locked loops; Propagation delay; System testing; Time measurement; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528015
Filename
528015
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