Title :
Achieving ±30 ps accuracy in the ATE environment
Author_Institution :
Wave Technol. Corp., Santa Clara, CA, USA
Abstract :
This paper deals with solving the problems of interfacing existing ATE to external time measurement instruments for making propagation delay and jitter measurements with accuracies of ±30 ps, jitter <5 ps for testing PLL, LAN/Telecom devices
Keywords :
SPICE; automatic test equipment; integrated circuit testing; jitter; local area networks; peripheral interfaces; phase locked loops; telecommunication equipment testing; timing; 5 ps; ATE environment; LAN/Telecom devices; PLL; external time measurement instruments; interfacing; jitter measurements; propagation delay; Clocks; Distortion measurement; Instruments; Jitter; Manufacturing; Phase locked loops; Propagation delay; System testing; Time measurement; Working environment noise;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528015
