Application of optoelectronic techniques to high speed testing

Author

Sokolowska, Ewa ; Kaminska, Bozena

Author_Institution

Ecole Polytech., Montreal, Que., Canada

fYear

34608

Firstpage

710

Lastpage

719

Abstract

The concept and experimental results for the novel optoelectronic architecture of the IC tester allowing very high test rates is presented. This architecture is based on our new alternative approach of encoding the data implying double optical pulses. The validity of the concept has been confirmed with the simulation results. This new method along with optical multiplexing and self-clocked optical distribution resulted in outstanding performance and revealed numerous possibilities for the proposed architecture

Keywords

built-in self test; design for testability; digital simulation; encoding; integrated circuit testing; measurement by laser beam; photodetectors; very high speed integrated circuits; IC tester; double optical pulses; encoding; high speed testing; optical multiplexing; optoelectronic architecture; optoelectronic techniques; power budget analysis; self-clocked optical distribution; simulation results; Bandwidth; Circuit testing; Digital integrated circuits; Electronic equipment testing; Frequency; Gallium arsenide; High speed optical techniques; Integrated circuit testing; Integrated optics; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1994. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2103-0

Type

conf

DOI

10.1109/TEST.1994.528017

Filename

528017