• DocumentCode
    1697001
  • Title

    Closed loop solder-lines on heated substrates

  • Author

    Seong-A Kim ; Seo, Young H. ; Cho, Young-Ho ; Ho Kim, Geun ; Park, Jae Y. ; Bu, Jong U.

  • Author_Institution
    Digital Nanolocomotion Center, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1101
  • Lastpage
    1105
  • Abstract
    Wafer level MEMS vacuum packaging has been newly designed, fabricated, and characterized by utilizing silicon bulk micromachining and closed loop solder-line bonding. For evaluating the proposed MEMS packaging, a packaging specimen is fabricated which comprises of cap and device substrates. AuSn closed loop solder lines are formed on the cap substrate and feedthroughs are fabricated on the device substrate with deflection diaphragms, respectively. The proposed package can be utilized in wafer level packaging, chip scale packaging, and low cost packaging due to the low process temperature, the compatible fabrication sequences with MEMS devices and a specified pressure endurance. It can be also applied in packaging integrated micro-systems comprised of various components, sensors, and actuators with different processing/working temperature by utilizing the closed loop solder-line on the heated substrate.
  • Keywords
    chip scale packaging; elemental semiconductors; micromachining; micromechanical devices; semiconductor device packaging; silicon; AuSn; chip scale packaging; closed loop solder-lines; deflection diaphragms; heated substrates; integrated micro-systems; micromachining; process temperature; vacuum packaging; wafer level MEMS; Chip scale packaging; Costs; Fabrication; Microelectromechanical devices; Micromachining; Micromechanical devices; Silicon; Temperature sensors; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008239
  • Filename
    1008239