DocumentCode
1697116
Title
Non-volatile programmable devices and in-circuit test
Author
Raymond, Douglas W. ; Haigh, Dominic ; Bodick, Ray ; Ryan, Barbara ; McCombs, Dale
Author_Institution
Teradyne Inc., USA
fYear
34608
Firstpage
817
Lastpage
823
Abstract
Once various obstacles are overcome, board testers can serve as programming stations for in-circuit-writable devices such as FPGAs, microcontrollers, EEPROMs, and flash memories. Manufacturing cost and cycle time can be considerably reduced
Keywords
EPROM; PLD programming; field programmable gate arrays; integrated circuit testing; integrated memory circuits; logic testing; microcontrollers; printed circuit testing; EEPROM; FPGA; board testers; cycle time; flash memories; in-circuit test; in-circuit-writable devices; manufacturing cost; microcontrollers; nonvolatile programmable devices; programming stations; Circuits; Costs; EPROM; Electronic equipment testing; Field programmable gate arrays; Flash memory; Logic design; Logic devices; Manufacturing; PROM;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528029
Filename
528029
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