• DocumentCode
    169713
  • Title

    Incremental Effect Modeling of Binary Count Data Using Logistic Regression with Categorical Predictors

  • Author

    Haeil Ahn

  • Author_Institution
    Dept. of Ind. Eng., Seokyeong Univ., Seoul, South Korea
  • fYear
    2014
  • fDate
    6-9 May 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this study, we have considered the modeling and analyses of binary data. We modeled binary data with categorical predictors, using logistic regression to develop a statistical method. We found that ANOVA-type analyses often performed unsatisfactory, even when using arcsine-square-root trans-formations. We concluded that such methods are not appropriate, especially in cases where the fractions were close to 0 or 1. The logistic transformation of fraction data could be a promising alternative, but it is not desirable in the statistical sense. The major purpose of this paper is to demonstrate that logistic regression with an ANOVA-model like parameterization aids our understanding and provides a somewhat different, but sound, statistical background. We examined a simple real world example to show that we can efficiently test the significance of regression parameters, look for interactions, estimate related confidence intervals, and calculate the difference between the mean values of the referent and experimental subgroups. This paper demonstrates that precise confidence interval estimates can be obtained using the proposed ANOVA-model like approach. The method discussed here can be extended to any type of experimental fraction data analysis, particularly for experimental design.
  • Keywords
    data analysis; logistics; regression analysis; ANOVA-model like approach; ANOVA-model like parameterization aids; ANOVA-type analysis; arcsine-square-root transformation; binary count data; binary data analysis; categorical predictor; confidence interval; experimental fraction data analysis; incremental effect modeling; logistic regression; logistic transformation; regression parameter; statistical background; statistical method; statistical sense; Analysis of variance; Data models; Logistics; Manufacturing; Mathematical model; Predictive models; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science and Applications (ICISA), 2014 International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4799-4443-9
  • Type

    conf

  • DOI
    10.1109/ICISA.2014.6847414
  • Filename
    6847414