Title :
Do you practice safe test? What we found out about your habits
Author :
Dean, Cecil A. ; Zorian, Yervant
Author_Institution :
AT&T Bell Labs., Merrimack Valley, MA, USA
Abstract :
In this paper we look at the results of a yearlong benchmarking effort in the area of IC-level design for testability (DFT). While visiting 10 leading edge companies, we looked at things such as their testability policies, reviews, process for adding testability, their intervals, fault coverage results, and if and where in the system the IC-level self-test was used
Keywords :
application specific integrated circuits; automatic testing; boundary scan testing; built-in self test; design for testability; integrated circuit testing; production testing; ASIC; AT&T TSBU; Alcatel; Hewlett Packard; IC-level self-test; NCR; Northern Telecom; Segate Technology; Siemens; benchmarking; computer aided test; design for testability; fault coverage; safe test; structured testability; timing effects; Automatic testing; Benchmark testing; Built-in self-test; Companies; Geographic Information Systems; Integrated circuit testing; Logic devices; Process design; System testing; Telecommunications;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528036
