• DocumentCode
    1697282
  • Title

    Development of dynamic test system for digital relay protection based on IEC61850 standards

  • Author

    Tang Baofeng ; Li Xianmei ; Yang Xiao ; Fan Hui

  • Author_Institution
    Power Syst. Digital Simulation Lab., Hebei Electr. Power Res. Inst., Shijiazhuang, China
  • Volume
    2
  • fYear
    2011
  • Firstpage
    1594
  • Lastpage
    1597
  • Abstract
    In recent years, electronic mutual-inductor and IEC61850 serial standards are adopted in digital substation. Once electronic mutual-inductor has been used, the input signals of relay protection and other secondary devices are not the traditional analog quantities any more. The simulation system cannot offer such interface up to now, so the secondary devices which are based on electronic mutual-inductor in digital substation cannot be tested and researched in this way. A kind of testing system aiming to real-time digital relay protection is introduced in this paper. By adding secondary interface to the primary simulation system, such as ADPSS (invented by China Electric Power Research Institute), a closed-loop testing system which is based on IEC61850 standards is established. The testing results verify that the system has great significance on improving the application of digital substation, and it has great use value.
  • Keywords
    power inductors; relay protection; substation protection; transformer substations; IEC61850 serial standards; analog quantity; closed-loop testing system; digital substation; dynamic test system; electronic mutual-inductor; primary simulation system; real-time digital relay protection; secondary device; secondary interface; Data conversion; Object oriented modeling; Optical switches; Power system dynamics; Substations; Synchronization; IEC61850; digital substation; dynamic test; photoelectricity transformer; secondary interface;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Power System Automation and Protection (APAP), 2011 International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-9622-8
  • Type

    conf

  • DOI
    10.1109/APAP.2011.6180551
  • Filename
    6180551