• DocumentCode
    1697325
  • Title

    A 1.2 ns/1 ns 1 K*16 ECL dual-port cache RAM

  • Author

    Shin, H.J. ; Lu, P.F. ; Chin, K. ; Chuang, C.-T. ; Warnock, J.D. ; Franch, R.L.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1993
  • Firstpage
    244
  • Lastpage
    245
  • Abstract
    An experimental 1-k*16 ECL (emitter coupled logic) dual-port cache RAM block that has a read/write port and an independently accessible read-only port is presented. Multiples of this block can be used to construct a high-performance, large-capacity cache memory. This dual-port memory cell is constructed by adding a differential emitter-coupled sense circuit for the read-only port to the p-n-p-load (or SCR-type) bipolar read/write single-port cell. The p-n-p-load cell is chosen because of its smaller area and better soft-error immunity than other types of bipolar memory cells. The cache block is fabricated using a 0.8- mu m, trench-isolated, double-poly, self-aligned 3.6-V Si-bipolar technology with double metal layers and a W local-interconnection layer.<>
  • Keywords
    bipolar integrated circuits; buffer storage; elemental semiconductors; emitter-coupled logic; integrated memory circuits; random-access storage; silicon; 0.8 micron; 1 ns; 1.2 ns; 16 kbit; 3.6 V; ECL dual-port cache RAM; Si-bipolar technology; W local-interconnection layer; W-Si; differential emitter-coupled sense circuit; double metal layers; double poly self-aligned technology; dual-port memory cell; emitter coupled logic; large-capacity cache memory; p-n-p-load; read/write port; soft-error immunity; trench-isolated; Cache memory; Clamps; Decoding; Driver circuits; Energy consumption; High performance computing; Random access memory; Read-write memory; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1993. Digest of Technical Papers. 40th ISSCC., 1993 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0987-1
  • Type

    conf

  • DOI
    10.1109/ISSCC.1993.280030
  • Filename
    280030