Title :
Structure and metrology for a single-wire analog testability bus
Author :
Lu, Yunsheng ; Mao, Weiwei ; Dandapani, R. ; Gulati, Ravi K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
Abstract :
A structure for testing the interconnect faults and measurement of discrete components on mixed-signal boards is proposed. The structure requires one analog pin in addition to the IEEE 1149.1 pins on each mixed-signal IC. Simulation results are provided to show the accuracy of the metrology
Keywords :
IEEE standards; automatic testing; boundary scan testing; design for testability; fault location; mixed analogue-digital integrated circuits; printed circuit testing; IEEE 1149.1 pins; analog pin; discrete components; interconnect faults; mixed-signal IC; mixed-signal boards; simulation results; single-wire analog testability bus; Analog integrated circuits; Current measurement; Integrated circuit interconnections; Metrology; Pins; Switches; Switching circuits; Testing; Voltage; Voltmeters;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528041
