DocumentCode
1697392
Title
Using deep RIE for micromachining SOI wafers
Author
Belov, Nickolai ; Khe, Nguyen
Author_Institution
IC Sensors, Milpitas, CA, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
1163
Lastpage
1166
Abstract
The paper summarizes our experience with deep RIE etching of silicon for MEMS applications, including optical MEMS and sensors, with emphasis on deep RIE of SOI wafers. Most of the reported results have been achieved using the STS ICP RIE etcher with a mechanical chuck. The major issues discussed are: special tooling for deep RIE for MEMS applications, wafer/structures overheating, masking materials, etch depth non-uniformity across the wafer, and etch profile.
Keywords
micromachining; silicon-on-insulator; sputter etching; MEMS sensor; SOI wafer; STS ICP RIE etcher; Si; deep RIE etching; mechanical chuck; micromachining; optical MEMS; Application specific integrated circuits; Etching; Helium; Micromachining; Micromechanical devices; Optical sensors; Polymers; Resists; Silicon; Sociotechnical systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008252
Filename
1008252
Link To Document