Title :
Using deep RIE for micromachining SOI wafers
Author :
Belov, Nickolai ; Khe, Nguyen
Author_Institution :
IC Sensors, Milpitas, CA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
The paper summarizes our experience with deep RIE etching of silicon for MEMS applications, including optical MEMS and sensors, with emphasis on deep RIE of SOI wafers. Most of the reported results have been achieved using the STS ICP RIE etcher with a mechanical chuck. The major issues discussed are: special tooling for deep RIE for MEMS applications, wafer/structures overheating, masking materials, etch depth non-uniformity across the wafer, and etch profile.
Keywords :
micromachining; silicon-on-insulator; sputter etching; MEMS sensor; SOI wafer; STS ICP RIE etcher; Si; deep RIE etching; mechanical chuck; micromachining; optical MEMS; Application specific integrated circuits; Etching; Helium; Micromachining; Micromechanical devices; Optical sensors; Polymers; Resists; Silicon; Sociotechnical systems;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008252