• DocumentCode
    1697392
  • Title

    Using deep RIE for micromachining SOI wafers

  • Author

    Belov, Nickolai ; Khe, Nguyen

  • Author_Institution
    IC Sensors, Milpitas, CA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1163
  • Lastpage
    1166
  • Abstract
    The paper summarizes our experience with deep RIE etching of silicon for MEMS applications, including optical MEMS and sensors, with emphasis on deep RIE of SOI wafers. Most of the reported results have been achieved using the STS ICP RIE etcher with a mechanical chuck. The major issues discussed are: special tooling for deep RIE for MEMS applications, wafer/structures overheating, masking materials, etch depth non-uniformity across the wafer, and etch profile.
  • Keywords
    micromachining; silicon-on-insulator; sputter etching; MEMS sensor; SOI wafer; STS ICP RIE etcher; Si; deep RIE etching; mechanical chuck; micromachining; optical MEMS; Application specific integrated circuits; Etching; Helium; Micromachining; Micromechanical devices; Optical sensors; Polymers; Resists; Silicon; Sociotechnical systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008252
  • Filename
    1008252