• DocumentCode
    1697586
  • Title

    A low-cost 64/spl times/64 uncooled infrared detector array in standard CMOS

  • Author

    Eminoglu, S. ; Tanrikulu, M.Y. ; Akin, T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Middle East Tech. Univ., Ankara, Turkey
  • Volume
    1
  • fYear
    2003
  • Firstpage
    316
  • Abstract
    This paper reports the development of a low-cost, 64/spl times/64 uncooled infrared focal plane array (FPA) based on suspended and thermally isolated p/sup +/-active/n-well diodes in a standard 0.35 /spl mu/m CMOS process. The array is implemented using a simple post-CMOS process that do not require any critical lithography or complicated deposition steps. The pixel is 40 /spl mu/m/spl times/40 /spl mu/m in size with a fill factor of 44%, and it has a measured DC responsivity of 4970 V/W with a thermal time constant of 36 msec at 80 mTorr vacuum. The detector noise is measured as 0.52 /spl mu/V for a 4 kHz electrical bandwidth with a 1/f corner frequency of 4.4 Hz, resulting in a measured detectivity of 9.7/spl times/10/sup 8/cm Hz/sup 1/2/W and an estimated NETD value of 470 mK for an f=1 optics. The FPA is scanned at 30 fps using a 16-channel parallel readout circuit with low noise preamplifiers. The preamplifiers have a measured noise of 0.48 /spl mu/V, resulting in an overall estimated NETD of 800 mK, which can be decreased by increasing the number of parallel readout channels. The uncompensated pixel voltage non-uniformity is measured as 0.82%, which easily decreases down to 0.05% by compensating the fixed pattern noise. Considering its simple fabrication method and its moderate performance, this approach is suitable for low-cost commercial infrared imaging applications.
  • Keywords
    CMOS integrated circuits; bolometers; focal planes; infrared detectors; integrated circuit noise; preamplifiers; readout electronics; 0.35 micron; 36 ms; 4 kHz; 4.4 kHz; 80 mtorr; DC responsivity; channel parallel readout circuit; complementary metal oxide semiconductor; detectivity; detector noise; electrical bandwidth; fill factor; fixed pattern noise; infrared focal plane array; infrared imaging applications; low noise preamplifier; parallel readout channels; standard CMOS; suspended p/sup +/-active/n-well diodes; thermal time constant; thermally isolated p/sup +/-active/n-well diodes; uncompensated pixel voltage; uncooled infrared detector array; Circuit noise; Diodes; Electric variables measurement; Frequency estimation; Frequency measurement; Infrared detectors; Noise measurement; Optical noise; Preamplifiers; Sensor arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1215316
  • Filename
    1215316