Title :
Using SCAN Bridge as an IEEE 1149.31 protocol addressable, multi-drop, backplane test bus
Author_Institution :
Nat. Semicond. Corp., South Portland, ME, USA
Abstract :
National Semiconductor´s SCAN Bridge is being used to provide an addressable, multi-drop, 1149.1-based backplane test bus. Its architecture is based upon defining two additional protocols to extend IEEE 1149.1 for use as a backplane test bus: an address protocol and a park protocol. These allow features such as the single, multicast, and broadcast address modes of P1149.5 to be included in the bridge
Keywords :
IEEE standards; automatic test equipment; measurement standards; peripheral interfaces; protocols; system buses; IEEE 1149.31 multi-drop backplane test bus; National Semiconductor; P1149.5; SCAN(nn) Bridge; address protocol; park protocol; Access protocols; Backplanes; Bridges; Broadcasting; Built-in self-test; Counting circuits; Hardware; Pins; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528053
