• DocumentCode
    1697649
  • Title

    Using SCAN Bridge as an IEEE 1149.31 protocol addressable, multi-drop, backplane test bus

  • Author

    Andrews, John

  • Author_Institution
    Nat. Semicond. Corp., South Portland, ME, USA
  • fYear
    34608
  • Firstpage
    1019
  • Abstract
    National Semiconductor´s SCAN Bridge is being used to provide an addressable, multi-drop, 1149.1-based backplane test bus. Its architecture is based upon defining two additional protocols to extend IEEE 1149.1 for use as a backplane test bus: an address protocol and a park protocol. These allow features such as the single, multicast, and broadcast address modes of P1149.5 to be included in the bridge
  • Keywords
    IEEE standards; automatic test equipment; measurement standards; peripheral interfaces; protocols; system buses; IEEE 1149.31 multi-drop backplane test bus; National Semiconductor; P1149.5; SCAN(nn) Bridge; address protocol; park protocol; Access protocols; Backplanes; Bridges; Broadcasting; Built-in self-test; Counting circuits; Hardware; Pins; Semiconductor device testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1994. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2103-0
  • Type

    conf

  • DOI
    10.1109/TEST.1994.528053
  • Filename
    528053
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1697649