DocumentCode
1697664
Title
Soft error and energy consumption interactions: a data cache perspective
Author
Li, Lin ; Degalahal, Vijay ; Vijaykrishnan, V. ; Kandemir, Mahmut ; Irwin, Mary Jane
Author_Institution
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
fYear
2004
Firstpage
132
Lastpage
137
Abstract
Energy-efficiency and reliability are two major design constraints influencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the leakage optimization techniques can have very different reliability behavior as compared to an original cache with no leakage optimizations. Next, we investigate on providing data reliability in an energy-efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerful error protection scheme for a longer time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.
Keywords
adaptive codes; cache storage; error correction codes; error detection codes; leakage currents; low-power electronics; memory architecture; microprocessor chips; adaptive error coding scheme; architectural-level leakage reduction; cache decay; data reliability; drowsy cache; dynamic energy; early-write-back scheme; error protection components; leakage optimization; next generation system designs; on-chip data caches; power consumption-reliability interaction; soft-errors; Cache memory; Circuits; Computer errors; Energy consumption; Energy efficiency; Error correction; Power system reliability; Protection; Threshold voltage; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Print_ISBN
1-58113-929-2
Type
conf
DOI
10.1109/LPE.2004.1349323
Filename
1349323
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