DocumentCode :
1697707
Title :
1149.1 scan control transport levels
Author :
Gage, Robert
Author_Institution :
Sequent Comput. Syst., Beaverton, OR, USA
fYear :
34608
Firstpage :
1022
Abstract :
1149.1 scan constitutes the most general standard of electronic hardware test control available today. Delivery of an 1149.1 scan service from maintenance processors to system components constitutes a universal challenge to systems designers, and a major opportunity for venders in the chip and scan software business. A largely neglected level of scan transport may rapidly become important to system designers. Offerings in the scan distribution arena can be separated into a number of classes, which can be seen to have a certain hierarchy. In the middle of all of these services is a scan control chip. It is driven by a microprocessor and emits a serial scan string. The author describes the four levels of transport
Keywords :
IEEE standards; automatic test equipment; boundary scan testing; peripheral interfaces; system buses; IEEE 1149.1 scan control transport levels; Mux mechanism; distributed scan control; electronic hardware test control; maintenance processors; packetised bus protocols; scan distribution; scan transport; system components; Clocks; Control systems; Electronic equipment testing; Hardware; Microprocessors; Silicon carbide; Software maintenance; Switches; System testing; Transport protocols;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2103-0
Type :
conf
DOI :
10.1109/TEST.1994.528056
Filename :
528056
Link To Document :
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