Title :
Observations on the 1149.x family of standards
Author :
Parker, Kenneth P.
Author_Institution :
Manuf. Test Div., Hewlett-Packard Co., Loveland, CO, USA
Abstract :
Five years of experience with the IEEE 1149.1 standard are discussed. It has been widely accepted across the electronics industry. It has made major contributions to board level testability. However, the advancement of the 1149.1 standard has not been as rapid as one might have imagined and there are some outstanding problems that it does not well address. As a member of the 1149.1 and P1149.4 working groups, as well as a developer of software for ATE systems, the author is interested in what one can learn from the 1149 and discusses his experiences in this field
Keywords :
IEEE standards; automatic test equipment; automatic testing; boundary scan testing; integrated circuit testing; ATE; CMOS testing; IEEE 1149.1 standard; IEEE 1149.1 working group; P1149.4 working groups; SAMPLE behavior; board level testability; boundary scan testing; electronics industry; Circuit synthesis; Circuit testing; Design engineering; Electronic design automation and methodology; Manufacturing; Process design; Proposals; Silicon; Software systems; Standards development;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.528057
