• DocumentCode
    1698086
  • Title

    FDTD- based TTEM Cell field distribution

  • Author

    Liu, Lina ; Zhu, Feng ; Ouyang, Juan ; Zhao, Guoqun

  • Author_Institution
    Coll. of Electr. Eng., Southwest Jiaotong Univ., Chengdu
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    By taking advantage of FDTD with Murpsilas 2 order absorbing boundary condition, this paper made specific analysis on the field distribution of the principal part of TTEM cell. The relationship among the dimension of EUT (equipment under test) and the evenness of field distribution and the characteristic impedances are given. This can provide theoretical basis for the design of TTEM cell.
  • Keywords
    TEM cells; electronic equipment testing; finite difference time-domain analysis; EUT dimension; FDTD; Mur 2 order boundary condition; TTEM cell field distribution; equipment under test dimension; finite difference time-domain analysis; triple transverse electromagnetic cell; Aluminum; Boundary conditions; Conductors; Educational institutions; Finite difference methods; Impedance; Lattices; TEM cells; Testing; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Congress, 2008. WAC 2008. World
  • Conference_Location
    Hawaii, HI
  • Print_ISBN
    978-1-889335-38-4
  • Electronic_ISBN
    978-1-889335-37-7
  • Type

    conf

  • Filename
    4699112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1698086